Evaluating system for a dual focus lens

Details Evaluating system for a dual focus lens Evaluating system for a dual focus lens

1997-07-24

2000-01-25

Kim, Robert H.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, G01B 902

Patent

active

060183934

ABSTRACT:
An lens evaluating system for evaluating a dual-focus lens is disclosed. The lens evaluating system is provided with an interferometer to form an image of interference fringes and a masking system which masks a part of the image corresponding to a noise component.

REFERENCES:
patent: 5379105 (1995-01-01), Iki et al.
patent: 5432606 (1995-07-01), Noguchi et al.
"Superresolution Readout System with Electrical Equalization for Optical Disks" by Takaya Tanabe, Applied Optics, vol. 34, No. 29, Oct. 10, 1995.
"Aberration Limits for Annular Gaussian Beams for Optical Storage" by T.C. Strand and H. Werlich, Applied Optics, No. 16, Jun. 1, 1994.

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