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Semiconductor structures and manufacturing methods

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Semiconductor wafer alignment methods and semiconductor...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Semiconductor wafer alignment tools

Optics: measuring and testing – By alignment in lateral direction
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Semiconductor wafer bearing alignment mark for use in...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Sensor alignment apparatus for an analysis system

Optics: measuring and testing – By alignment in lateral direction – With light detector
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Sensor device and position determination process and their use f

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Servo-control alignment of nonlinear crystals

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Shape measuring method and shape measuring device, position...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Shot averaging for fine pattern alignment with minimal...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Single lens repeater

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Single tone process window metrology target and method for...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Six degree of freedom position ranging

Optics: measuring and testing – By alignment in lateral direction
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Slide misload detection system and method

Optics: measuring and testing – By alignment in lateral direction – With light detector
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Spectroscopically measured overlay target

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Split-field pupil plane determination apparatus

Optics: measuring and testing – By alignment in lateral direction
Patent

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Stage apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Stage apparatus, projection optical apparatus and exposure...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Stage controller and exposure method in which position of...

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Stage device having drive mechanism for driving a movable...

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Stage mechanism

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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