Search
Selected: A

Atomic force microscope using cantilever attached to optical mic

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscope with probe with improved tip movement

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy

Measuring and testing – Surface and cutting edge testing – Roughness
Reissue Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy measurements of contact resistance...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy measurements of contact resistance...

Measuring and testing – Coating material: ink adhesive and/or plastic
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy measurements of contact resistance...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy measurements of contact resistance...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy measurements of contact resistance...

Measuring and testing – Testing of apparatus
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy measurements of contact resistance...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy scanning and image processing

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic force microscopy scanning methods

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic photo-absorption force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomic probe microscope and cantilever unit for use in the micro

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomized flux application to simulate soldering

Measuring and testing – Simulated environment
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomizer monitoring system

Measuring and testing – Embrittlement or erosion
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Atomizing, continuous, water monitoring module

Measuring and testing – Liquid analysis or analysis of the suspension of solids in a... – Content or effect of a constituent of a liquid mixture
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Attachable member, attaching mechanism, and printer

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.