Search
Selected: All

Coaxial probe with cantilever and scanning micro-wave...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Compact atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Compact atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Constant force stylus profiling apparatus and method

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Constant-force profilometer with stylus-stabilizing sensor assem

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Contour measuring apparatus with a stylus

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Controlled force microscope for operation in liquids

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Controlling engagement of a scanning microscope probe with a seg

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Controlling motion of a scanning force microscope probe tip...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Correlation sample for scanning probe microscope and method...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Coupled oscillator scanning imager

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Crankshaft journal surface gauge and kit thereof

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Cryogenic atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Crystal evaluation apparatus and crystal evaluation method

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Deconvolving tip artifacts using multiple scanning probes

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Deflection measuring system

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Deflector roll for measuring and checking the flatness of sheet

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detecting fields with a single-pass, dual-amplitude-mode scannin

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detecting fields with a single-pass, dual-amplitude-mode...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detecting fields with a single-pass, dual-amplitude-mode...

Measuring and testing – Surface and cutting edge testing – Roughness
Utility Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.