Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1997-06-02
1999-06-29
Noland, Thomas P.
Measuring and testing
Surface and cutting edge testing
Roughness
G01B 734
Patent
active
059182741
ABSTRACT:
A scanning probe microscope operates in the manner of an atomic force microscope during intermittant periods of scanning motion, in which a sample surface is driven so that a scan line on the surface is moved past a probe tip being vibrated in engagement with the surface. Between these intermittant periods of scanning motion, the vibrating probe tip is moved out of engagement with the sample surface, so that the amplitude and phase shift of probe tip vibrations are determined by the gradient of a force field extending outward from the sample surface, Such a force field is established when the probe tip is attracted by, or repelled from, a magnetic or electric field at or near the sample surface. For each sample point, the system stores data representing the height of the sample surface and the force field.
REFERENCES:
patent: 4724318 (1988-02-01), Binning
patent: 4954704 (1990-09-01), Elings et al.
patent: 5338932 (1994-08-01), Theodore et al.
patent: 5416327 (1995-05-01), Weiss et al.
patent: 5418363 (1995-05-01), Elings et al.
patent: 5481908 (1996-01-01), Gamble
patent: 5507179 (1996-04-01), Gamble et al.
patent: 5646339 (1997-07-01), Bayer et al.
patent: 5700953 (1997-12-01), Hlady et al.
patent: 5723775 (1998-03-01), Watanabe et al.
patent: 5729015 (1998-03-01), Tong
IBM Technical Disclosure Bulletin, Fast Image Acquisiton wih Scanning Tunneling Microscope or Atomic Force Microscope vol. 36, No. 03, Mar., 1993, p. 93. & p. 94.
"Scanning Probe Microscopy Technology & Recent Innovations" Y.E. Strausser, et al, American Laboratory, May, 1994. 8 pages.
"Magnetic Force Microscopy: . . . Media" Aug.--D. Rugar, et al, Journal of Applied Physics, vol. 68(3), 1990, pp. 1169-1183.
"Magnetic Imaging by "Force Microscop". . . Resolution" May--Martin and Wickramasinghe, Applied Physics Letters, vol. 50, 1987, pp. 1455-1457.
"Seperation of Magnetic . . . in Force Microscopy" Jun.--Schonenberger et al., Journal of Applied Physics, vol. 67, 1990, pp. 7278-7280.
R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy--Methods and Applications, Cambridge University Press, 1994, pp. 241-243 and 253-256.
Chen Dong
Flecha Edwin
Hammond James Michael
Roessler Kenneth Gilbert
Davidge R. V.
International Business Machines - Corporation
Noland Thomas P.
Tomlin R. A.
LandOfFree
Detecting fields with a single-pass, dual-amplitude-mode scannin does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Detecting fields with a single-pass, dual-amplitude-mode scannin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Detecting fields with a single-pass, dual-amplitude-mode scannin will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1387478