Compact atomic force microscope

Details Compact atomic force microscope Compact atomic force microscope

1991-04-19

1993-03-02

Raevis, Robert

Measuring and testing

Surface and cutting edge testing

Roughness

G01B 528

Patent

active

051899060

ABSTRACT:
This is an atomic force microscope in which the sensor can be built as a very small integrated structure. The sensor utilizes optical interference and can be operated in either the contact mode for high resolution or in the non-contact mode to measure electric and magnetic fields. One configuration of this microscope is a stand-alone configuration in which the microscope can be placed on or be suspended above large samples for scanning of small local areas thereof. The sensor is built into a scanner so that the sensor can be scanned over a stationary sample.

REFERENCES:
patent: H371 (1987-11-01), Bobb
patent: 3049002 (1962-08-01), Hediger
patent: 4665739 (1987-05-01), Mizuno
patent: 4724318 (1988-02-01), Binnig

Affiliated with

Also associated with

Rating

Compact atomic force microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Compact atomic force microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compact atomic force microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-120021