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Aligning method and apparatus

Image analysis – Applications – Manufacturing or product inspection
Patent

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Aligning rectilinear images in 3D through projective...

Image analysis – Applications – 3-d or stereo imaging analysis
Reexamination Certificate

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Aligning rectilinear images in 3D through projective...

Image analysis – Applications – 3-d or stereo imaging analysis
Reexamination Certificate

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Aligning rectilinear images in 3D through projective...

Image analysis – Applications – 3-d or stereo imaging analysis
Reexamination Certificate

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Alignment detection apparatus

Image analysis – Applications – Manufacturing or product inspection
Patent

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Alignment mark for e-beam inspection of a semiconductor wafer

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Alignment method for registering medical images

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Alignment of images for stitching

Image analysis – Image transformation or preprocessing – Combining image portions
Reexamination Certificate

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Alignment of printed circuit board targets

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Alignment of tape cartridge accessor

Image analysis – Image transformation or preprocessing – Measuring image properties
Reexamination Certificate

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Alignment system for an optical matched filter correlator

Image analysis – Histogram processing – For setting a threshold
Patent

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All surface data for use in substrate inspection

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Alpha image processing

Image analysis – Image compression or coding
Reexamination Certificate

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Alphanumeric handprint recognition

Image analysis – Histogram processing – For setting a threshold
Patent

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Alphanumeric image segmentation scheme

Image analysis – Image segmentation
Patent

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Alteration detection apparatus and method thereof

Image analysis – Applications
Reexamination Certificate

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Alteration of dither matrix size for full color dithering

Image analysis – Histogram processing – For setting a threshold
Patent

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Alternating phase shift mask inspection using biased...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Alternating phase-shift mask inspection method and apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Ambient light rejection filter

Image analysis – Applications – Personnel identification
Reexamination Certificate

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