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Integrated test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integrated test circuit, a test circuit, and a test method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integrated test method on multi-operating system platform

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Integrated test-on-chip system and method and apparatus for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integrated testing method for concurrent testing of a number...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Integrated testing of serializer/deserializer in FPGA

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integrating content-laden media with storage system

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Integration of embedded and test mode timer

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integration type input circuit and method of testing it

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integration type input circuit and method of testing it

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integration type input circuit and method of testing it

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Integration type input circuit and method of testing it

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Integrity tester for parallel signal bus

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Intelligent binning for electrically repairable semiconductor ch

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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