Intelligent binning for electrically repairable...

Details Intelligent binning for electrically repairable... Intelligent binning for electrically repairable...

2007-06-26

2007-06-26

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S704000

Reexamination Certificate

active

10608798

ABSTRACT:
The present invention relates to a system and method for testing one or more semiconductor devices (e.g., packaged chips). Test equipment performs at least tests of a first type on the semiconductor device and identifies failures in the semiconductor device, if any. A number of failures are determined. In the case where there are some failures, decision circuitry determines whether it is more efficient to repeat the tests or repair the semiconductor device, if it is repairable.

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