Integration type input circuit and method of testing it

Details Integration type input circuit and method of testing it Integration type input circuit and method of testing it

2007-07-17

2007-07-17

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C327S336000

Reexamination Certificate

active

10928179

ABSTRACT:
An input interface circuit is provided which includes an input transistor for receiving a digital input signal, a circuit for generating a reference value, and an integrating capacitor connected in series to a pair of current conducting electrodes of the input transistor for integrating the input signal. A logic level of the input signal is discriminated by comparing an integration of the input signal with the reference value. To provide a testing function, a test transistor is connected to a junction between the pair of current conducting electrodes of the input transistor and the integrating capacitor so that a current driving capability may be determined. Additionally, a discharge path circuit for controllably discharging the integrating capacitor is connected to the junction between the input transistor and the integrating capacitor.

REFERENCES:
patent: 6470466 (2002-10-01), Takahashi

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