Search
Selected: D

Delay element testing apparatus and integrated circuit having te

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Delay time measuring circuit

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detecting breakdown in dielectric layers

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detection of a variation in the environment of an integrated...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detector power linearity requirements and verification technique

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Determining cable attenuation and loss of signal threshold

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for shielding electromagnetic emissions of...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for testing a noise immunity...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for detecting and locating anomalies in the electromagnet

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for measuring electromagnetic interference

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Digital signal measurement apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Digital signal processing relating to near-end crosstalk cable m

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Display for measuring phase noise characteristics

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Distortion measurements with a vector network analyzer

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dual chambered anechoic chamber

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dual channel d.c. low noise measurement system and test methodol

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dual sine-wave time stamp method and apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dual sine-wave time stamp method and apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.