Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2005-08-09
2005-08-09
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S612000
Reexamination Certificate
active
06927580
ABSTRACT:
A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present or measured delay with at least one reference value.
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French Search Report from French Patent Application No. 01/11435, filed Sep. 4, 2001.
Balthazar Pierre
Bardouillet Michel
Wuidart Luc
Wuidart Sylvie
STMicroelectronics S.A.
Teresinski John
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