Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1993-09-30
1995-10-17
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
327250, 327252, 368120, H01L 2166
Patent
active
054594022
ABSTRACT:
A delay time measuring circuit includes a delay circuit for changing the delay times of first and second clock signals output to measure the delay time of an evaluated circuit according to an externally supplied control voltage, and a voltage controlled oscillator whose oscillation frequency is controlled by the same control voltage as that used for the delay circuit, and is constructed to measure the delay time of the evaluated circuit based on an output of the voltage controlled oscillator. Therefore, it is possible to precisely evaluate the operation speed of a circuit operating at high speed.
REFERENCES:
patent: 2925960 (1960-02-01), Clauss
patent: 3334303 (1967-08-01), Shepherd
patent: 4118665 (1978-10-01), Reinhardt
patent: 5012141 (1991-04-01), Tomisawa
patent: 5291141 (1994-03-01), Farwell
Scray: "Automatic Rise Time Measurement"--IBM Tech. Disc. Bulletin--Apr. 1960--p. 47.
Miyazawa Yuichi
Ueno Kiyoji
Kabushiki Kaisha Toshiba
Solis Jose M.
Wieder Kenneth A.
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