Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2008-05-27
2008-05-27
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S076780, C324S076620
Reexamination Certificate
active
11261897
ABSTRACT:
A time of an event can be determined by acquiring an amplitude, at the time of the event, of at least two periodic timing signals that are out of phase with each other. The time of the event within a cycle of at least one of the timing signals can be determined as a function of the amplitudes of the timing signals. The phase angle and complex coordinates of at least one of the timing signals can be determined as a function of the amplitudes. The time of the event within a cycle of a timing signal can be determined as a function of the phase angle or complex coordinates of the timing signal at the time of the event.
REFERENCES:
patent: 3363183 (1968-01-01), Bowling et al.
patent: 3471790 (1969-10-01), Kaps
patent: 3612906 (1971-10-01), Kennedy
patent: 3947697 (1976-03-01), Archer et al.
patent: 4119910 (1978-10-01), Hayashi
patent: 4488108 (1984-12-01), Treise et al.
patent: 4574234 (1986-03-01), Inbar
patent: 4607218 (1986-08-01), Stosel
patent: 4686458 (1987-08-01), Beyerbach et al.
patent: 5003194 (1991-03-01), Engelhard
patent: 5084669 (1992-01-01), Dent
patent: 5218289 (1993-06-01), Besson
patent: 5258968 (1993-11-01), Matsuda et al.
patent: 5293079 (1994-03-01), Knoch
patent: 5321700 (1994-06-01), Brown et al.
patent: 5381100 (1995-01-01), Hayashi
patent: 5420831 (1995-05-01), Muirhead
patent: 5471136 (1995-11-01), Pye
patent: 5568071 (1996-10-01), Hoshino et al.
patent: 5886660 (1999-03-01), Loewenstein
patent: 6233528 (2001-05-01), Lai et al.
patent: 6291981 (2001-09-01), Sartschev
patent: RE37716 (2002-05-01), Sutardja et al.
patent: 6437589 (2002-08-01), Sugano
patent: 6735543 (2004-05-01), Douskey et al.
patent: 0772201 (1997-05-01), None
patent: 63085489 (1988-04-01), None
patent: 08122465 (1996-05-01), None
patent: WO 2006/038559 (2006-04-01), None
PCT International Search Report and Written Opinion of the International Searching Authority for International Application No. PCT/US2006/041743, dated Jul. 10, 2007, 14 pages.
Foley & Lardner LLP
He Amy
Hirshfeld Andrew H.
Teradyne, Inc.
Trementozzi Ralph
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