Display for measuring phase noise characteristics

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C375S226000

Reexamination Certificate

active

07554338

ABSTRACT:
Time variation of phase noise characteristics is displayed for measurement. A peak power of a signal under test is detected to define the frequency as a reference frequency. An offset frequency from the reference frequency is repetitively changed and each time the phase noise power is integrated for a predetermined frequency width to evaluate an integration value. The integration values are divided by the predetermined frequency width. The divided values are further divided by the peak power to evaluate noise power ratios relative to the peak power. Then, relationship between the offset frequencies, noise characteristic values and time is displayed in a graph that shows the time variation of the phase noise characteristics.

REFERENCES:
patent: 5093751 (1992-03-01), Yuki et al.
patent: 5337014 (1994-08-01), Najle et al.
patent: 5457585 (1995-10-01), Christensen
patent: 6424229 (2002-07-01), Justice et al.
patent: 6535560 (2003-03-01), Masenten
patent: 6957019 (2005-10-01), Gupta et al.
patent: 7003414 (2006-02-01), Wichelman et al.
patent: 7035743 (2006-04-01), Gorin
patent: 7107011 (2006-09-01), Nakazawa et al.
patent: 7123112 (2006-10-01), Kang et al.
patent: 7164699 (2007-01-01), Braun et al.
patent: 7245650 (2007-07-01), Kuroyanagi et al.
patent: 7295937 (2007-11-01), Dutta et al.
patent: 7334253 (2008-02-01), Howard
patent: 2002/0171457 (2002-11-01), Fujiwara
patent: 2004/0092234 (2004-05-01), Pohjonen
patent: 2005/0238094 (2005-10-01), Bessho et al.
patent: 2006/0045198 (2006-03-01), Magee et al.
patent: 2006/0222192 (2006-10-01), Matthey
patent: 2008/0019433 (2008-01-01), Yamanouchi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Display for measuring phase noise characteristics does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Display for measuring phase noise characteristics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Display for measuring phase noise characteristics will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4071588

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.