Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1997-06-27
2000-05-02
Ballato, Josie
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324 7682, 324 7677, G08B 108, H01L 2706
Patent
active
06057691&
ABSTRACT:
A delay element testing apparatus has a signal generator for generating a plurality of signals, at least one of which is variable in timing; a phase comparator for making a comparison of a relationship in terms of phasic anteriority and posteriority between the signal passing through a delay element under test and the timing-variable signal among the plurality of signals; and a test result output circuit, controlled by a control signal generated by the phase comparator, for outputting a signal indicating a quality of a delay characteristic of the delay element under test. Main parts of this testing apparatus can be provided on a substrate to realize an integrated having a function for testing delay elements included therein.
REFERENCES:
patent: 2889515 (1959-06-01), Murphy
patent: 4118665 (1978-10-01), Reinhardt
patent: 5396183 (1995-03-01), Farwell
patent: 5471145 (1995-11-01), Mydill
patent: 5675265 (1997-10-01), Yamamori
patent: 5764598 (1998-06-01), Okayasu
Ballato Josie
Kabushiki Kaisha Toshiba
Solis Jose M.
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