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Structure of IC device interface unit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Structure of probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Structures for testing circuits and methods for fabricating...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Structures for testing circuits and methods for fabricating...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Structures to extract defect size information of poly and source

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Sub-sampling of weakly-driven nodes

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Submersible pump cable test method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Substrate aligning system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Substrate for a probe card having conductive layers for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate for inspecting electronic device, method of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate having self limiting contacts for establishing an elec

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Substrate impedance measurement

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate impedance measurement

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate inspection apparatus, substrate inspection method,...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Substrate inspection device and substrate inspecting method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate inspection using the propagation characteristics...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate surface potential measuring apparatus and plasma equip

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Substrate test apparatus and method of testing substrates

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate tester having shorting pad actuator method and apparat

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Substrate tester location clamping, sensing, and contacting meth

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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