Substrate tester having shorting pad actuator method and apparat

Details Substrate tester having shorting pad actuator method and apparat Substrate tester having shorting pad actuator method and apparat

1997-04-17

1999-06-29

Abrams, Neil

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324761, G01R 3102

Patent

active

059173297

ABSTRACT:
An electrical contacting apparatus for testing a substrate (54) and having a principal axis includes an electrical contact pad, a guide plate (106), a supporting bridge (132), and a mechanism for providing a contact actuation force. The guide plate includes side edges with guide pins (108) extending radially outward from a center of each side edge. The electrical contact pad (114) is mounted and centered upon a top surface of the guide plate (106). The support bridge supports the guide plate to enable a pivotal movement of the guide plate about a point on the principal axis. Lastly, the contact actuation force mechanism provides a contact actuation force to a center of the bottom surface of the guide plate to maintain an equal force across the electrical contact pad in a direction of the principal axis, whereby the electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between the electrical contact pad and a substrate being contacted. The substrate (54) is to be clamped between test probes (52) and the contact pad (114).

REFERENCES:
patent: 2341602 (1944-02-01), Dewey
patent: 2664860 (1954-01-01), Levetus
patent: 2966721 (1961-01-01), Bordignon et al.
patent: 3032331 (1962-05-01), Doty et al.
patent: 4139189 (1979-02-01), Wietrzyk
patent: 4436385 (1984-03-01), Fischer et al.
patent: 4438984 (1984-03-01), Leppala
patent: 5672977 (1997-09-01), Yamada
patent: 5825192 (1998-10-01), Hagihara

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