Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-04-08
1997-07-29
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324761, G01R 102, H01R 909
Patent
active
056525230
ABSTRACT:
An IC device interface unit increases a number of IC devices to be tested at the same time by a semiconductor test system without increasing an overall size of the interface unit. The IC device interface unit includes a pair of IC sockets for receiving IC devices to be tested wherein the IC sockets have a standard size defined in the industry, a sub-socket board for mounting the IC sockets on one surface by receiving contact leads projected from the IC sockets, a pair of terminal connectors to be mounted on the other surface of the sub-socket board wherein the terminal connectors have contact leads at both ends and one ends of which are connected to the sub-socket board, a socket board for receiving other ends of the terminal connector at one surface of the socket board, a pair of connect boards to be electrically connected to other surface of the socket board wherein the connect boards have contact leads at both ends and one ends of which are connected to the socket board and the other ends of which are connected to a performance board of the test head, and a sub-socket board spacer positioned between the sub-socket board and the socket board for providing a space for the terminal connector.
REFERENCES:
patent: 3701079 (1972-10-01), Bowden et al.
patent: 4713022 (1987-12-01), Pfaff
patent: 4950980 (1990-08-01), Pfaff
patent: 4984991 (1991-01-01), Nishimoto
patent: 5443404 (1995-08-01), Matsuoka
patent: 5485096 (1996-01-01), Aksu
Advantest Corporation
Nguyen Vinh P.
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