Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-04-17
2000-03-28
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324761, G01R 1302
Patent
active
060436670
ABSTRACT:
A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.
REFERENCES:
patent: 4436385 (1984-03-01), Fischer et al.
patent: 4820975 (1989-04-01), Diggle
patent: 5150041 (1992-09-01), Eastin et al.
patent: 5422575 (1995-06-01), Ferrer et al.
Cadwallader Robert H.
Morrison Thomas
Probst Klaus
Yager William A.
Capella Steven
International Business Machines - Corporation
Nguyen Vinh P.
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