Structure of probe

Details Structure of probe Structure of probe

2011-03-01

2011-03-01

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07898274

ABSTRACT:
A split-type probe is used to contact with an object under test to detect an electrical characteristic thereof. The probe provided by the present invention has a contact head used to contact with the object under test, and a first needle body and a second needle body. The first needle body is connected to the contact head to transmit a testing signal to the object under test for performing detection. In addition, the second needle body is also connected to the contact head to transmit a response signal generated by the object under test due to the testing signal to obtain the electrical characteristic of the object under test.

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“Office Action of Taiwan counterpart application”, issued on Dec. 7, 2009, p. 1-p. 5.
“Office Action of Japan Counterpart Application” issued on Feb. 23, 2010, p. 1-p. 3.

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