Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2007-03-06
2008-08-05
Tsai, Carol S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
C702S035000, C702S082000, C702S083000, C702S084000, C700S109000, C700S110000, C700S121000
Reexamination Certificate
active
07409306
ABSTRACT:
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.
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Barnett Thomas S.
Singh Adit D.
Auburn University
Haverstock & Owens LLP
Tsai Carol S
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