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Computational efficiency in photolithographic process...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
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Merging sub-resolution assist features of a...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
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Method and apparatus for performing stress modeling of...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
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Method for exploring feasibility of an electronic system design

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
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Methods and system for analysis and management of parametric...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
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Test yield estimate for semiconductor products created from...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
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Yield evaluating apparatus and method thereof

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