Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-07-25
2006-07-25
Lamarre, Guy (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C327S215000, C327S218000
Reexamination Certificate
active
07082560
ABSTRACT:
An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a first scan slave element capable of capturing data on a positive edge of a clock signal; and a second scan slave element capable of capturing data on a negative edge of the clock signal. An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a scan slave element capable of capturing data on either a positive edge or a negative edge of a clock signal; wherein a control signal determines whether the scan slave element captures data on the positive edge or negative edge of the clock signal.
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Parulkar Ishwardutt
Pham Ha M.
Lamarre Guy
Osha & Liang LLP
Sun Microsystems Inc.
Trimmings John P.
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