Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Examiner
active
No affiliations
AC LSSD/LBIST test coverage enhancement
Adaptive defect based testing
Algorithmically programmable memory tester with test sites...
Analog/digital characteristics testing device and IC testing...
Apparatus and method for compressing redundancy information...
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Profile ID: LFUS-PAI-P-2406658