Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Patent
1996-05-13
2000-03-14
McDonald, Rodney
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
216 67, 216 74, 216 80, 156345, 20419232, 20419233, 20419235, H05H 100
Patent
active
060368772
ABSTRACT:
A general method of the invention is to provide a polymer-hardening precursor piece (such as silicon, carbon, silicon carbide or silicon nitride, but preferably silicon) within the reactor chamber during an etch process with a fluoro-carbon or fluoro-hydrocarbon gas, and to heat the polymer-hardening precursor piece above the polymerization temperature sufficiently to achieve a desired increase in oxide-to-silicon etch selectivity. Generally, this polymer-hardening precursor or silicon piece may be an integral part of the reactor chamber walls and/or ceiling or a separate, expendable and quickly removable piece, and the heating/cooling apparatus may be of any suitable type including apparatus which conductively or remotely heats the silicon piece.
REFERENCES:
patent: 4123316 (1978-10-01), Tsuchimoto
patent: 4261762 (1981-04-01), King
patent: 4350578 (1982-09-01), Frieser et al.
patent: 4371412 (1983-02-01), Nishizawa
patent: 4427516 (1984-01-01), Levinstein et al.
patent: 4430547 (1984-02-01), Yoneda et al.
patent: 4457359 (1984-07-01), Holden
patent: 4512391 (1985-04-01), Harra
patent: 4565601 (1986-01-01), Kakehi et al.
patent: 4711698 (1987-12-01), Douglas
patent: 4755345 (1988-07-01), Baity, Jr. et al.
patent: 4756810 (1988-07-01), Lamont, Jr. et al.
patent: 4786359 (1988-11-01), Stark et al.
patent: 4793897 (1988-12-01), Dunfield et al.
patent: 4807016 (1989-02-01), Douglas
patent: 4810935 (1989-03-01), Boswell
patent: 4842683 (1989-06-01), Cheng et al.
patent: 4870245 (1989-09-01), Price et al.
patent: 4918031 (1990-04-01), Flamm et al.
patent: 4948458 (1990-08-01), Ogle
patent: 4948750 (1990-08-01), Kausche et al.
patent: 4990229 (1991-02-01), Campbell et al.
patent: 5000113 (1991-03-01), Wang et al.
patent: 5006220 (1991-04-01), Hijikata et al.
patent: 5015330 (1991-05-01), Okumura et al.
patent: 5074456 (1991-12-01), Degner et al.
patent: 5085727 (1992-02-01), Steger
patent: 5169487 (1992-12-01), Langley et al.
patent: 5173412 (1992-12-01), Kiener et al.
patent: 5187454 (1993-02-01), Collins et al.
patent: 5203956 (1993-04-01), Hansen
patent: 5241245 (1993-08-01), Barnes et al.
patent: 5249251 (1993-09-01), Egalon et al.
patent: 5258824 (1993-11-01), Carlson et al.
patent: 5276693 (1994-01-01), Long et al.
patent: 5277751 (1994-01-01), Ogle
patent: 5326404 (1994-07-01), Sato
patent: 5346578 (1994-09-01), Benzing et al.
patent: 5349313 (1994-09-01), Collins et al.
patent: 5392018 (1995-02-01), Collins et al.
patent: 5399237 (1995-03-01), Keswick et al.
patent: 5401350 (1995-03-01), Patrick et al.
patent: 5414246 (1995-05-01), Shapona
patent: 5421890 (1995-06-01), Campbell et al.
patent: 5423945 (1995-06-01), Marks et al.
patent: 5468341 (1995-11-01), Samukawa
patent: 5477975 (1995-12-01), Rice et al.
patent: 5514246 (1996-05-01), Blalock
patent: 5529657 (1996-06-01), Ishii
patent: 5556501 (1996-09-01), Collins et al.
J. Coburn, "Increasing . . . Etching", IBM Tech. Dis. Bulletin, vol. 19, No. 10, Mar. 1977.
Patent Abstracts of Japan, Publication No. 07288196 A, Oct. 31, 1995 (Tokyo Electron Ltd).
Patent Abstracts of Japan, Publication No. 08017799 A, Jan. 19, 1996 (Plasma Syst: KK).
Patent Abstracts of Japan, Publication No. 06196446 A, Jul. 15, 1994 (NEC Corp).
XP002047813 & JP 62 052 714A (Olympus Optical Co. Ltd), Mar. 7, 1987, Database WPI Section Ch, Week 8715, Derwent Publications, Ltd., London, GB,; AN 87-105079.
Patent Abstracts of Japan, vol. 006, No. 119 (E116), Jul. 3, 1982 & JP 57 045927 A (Fujitsu Ltd.), Mar. 16, 1982.
Coburn, W. J. "Increasing the Etch Rate Ratio oSiO.sub.2 /Si in Fluorocarbon Plasma Etching", IBM Technical Disclosure, vol. 19, No. 10, Mar. 1977.
Matsuo, Seitaro. "Selective etching of SiO.sub.2 relative to Si by plasma reactive sputter etching", J. Vac. Sc. Technology, vol. 17, No. 2, Mar.-Apr. 1980.
European Patent Office Communication Pursuant to Article 96(2) and Rule 51(2) EPC for Application No. 94307307.2-2208, mailed Jan. 17, 1996.
Buchberger Douglas
Collins Kenneth S.
Groechel David W.
Keswick Peter
Marks Jeffrey
Applied Materials Inc.
McDonald Rodney
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