LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for generating monochromatic X-ray...

X-ray or gamma ray systems or devices – Specific application – Absorption

Apparatus and method for identifying specific bone regions in di

X-ray or gamma ray systems or devices – Specific application – Absorption

Apparatus and method for image processing

X-ray or gamma ray systems or devices – Specific application – Absorption

Apparatus and method for imaging an object with real-time...

X-ray or gamma ray systems or devices – Computer tomography program or processor

Apparatus and method for imaging objects with wavefields

X-ray or gamma ray systems or devices – Specific application – Absorption

Apparatus and method for imaging objects with wavefields

X-ray or gamma ray systems or devices – Computer tomography program or processor

Apparatus and method for imaging objects with wavefields

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Apparatus and method for imaging with wavefields using inverse s

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for imaging with wavefields using inverse s

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Apparatus and method for improved energy dispersive X-ray...

X-ray or gamma ray systems or devices – Specific application – Mammography

Apparatus and method for improved tissue imaging

X-ray or gamma ray systems or devices – Photographic detector support – For plural exposures on single film or plate

Apparatus and method for improving diagnostic X-rays

X-ray or gamma ray systems or devices – Beam control

Apparatus and method for improving radiation coherence and reduc

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for in-situ measurement of residual...

X-ray or gamma ray systems or devices – Source – Electron tube

Apparatus and method for increasing X-ray tube power per...

X-ray or gamma ray systems or devices – Source

Apparatus and method for inhibiting the generation of excessive

X-ray or gamma ray systems or devices – Source – Electron tube

Apparatus and method for inhibiting the generation of excessive

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for inspecting a crystal

X-ray or gamma ray systems or devices – Source – Target

Apparatus and method for light weight high performance target