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Selected: E

Event sharing restoration for photon counting detectors

X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling
Reexamination Certificate

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Evidential reconstruction of vessel trees from X-ray angiograms

X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling
Patent

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Exact filtered back projection (FBP) algorithm for spiral...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Exact filtered back projection (FBP) algorithm for spiral...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Exact patient positioning by compairing reconstructed x-ray...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Exact region of interest cone beam imaging using 3D backprojecti

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Exact region of interest cone beam imaging without circle scans

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Exact region of interest cone beam imaging without circle scans

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Exact regional reconstruction of longitudinally-unbounded object

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Exact volume imaging involving multiple partial scans

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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EXAFS spectrometer

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Examination apparatus for perfusion studies

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Examination method and apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Examination method for the evaluation of location-dependent spec

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Examination of material samples

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Examination system utilizing ionizing radiation and a flexible,

X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling
Patent

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Examination system, image processing apparatus and method,...

X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling
Reexamination Certificate

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Examination system, image processing apparatus and method,...

X-ray or gamma ray systems or devices – Electronic circuit – With switching means
Reexamination Certificate

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Examination table providing x-ray densitometry

X-ray or gamma ray systems or devices – Source support – Including object support or positioning
Reexamination Certificate

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Examination table providing x-ray imaging

X-ray or gamma ray systems or devices – Source support – Including object support or positioning
Reexamination Certificate

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