Examination system, image processing apparatus and method,...

Details Examination system, image processing apparatus and method,... Examination system, image processing apparatus and method,...

2006-01-31

2006-01-31

Church, Craig E. (Department: 2882)

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

C378S116000

Reexamination Certificate

active

06993114

ABSTRACT:
A system for handling examination of an object includes an input for inputting examination request information, including a plurality of examination methods, for an object, and a performing device for performing examinations for the plurality of examination methods in an arbitrary order and obtaining results therefrom. In addition, an output outputs the results of the plurality of examination methods in a determined order regardless of an order in which the performing device has performed examinations for the plurality of examination methods.

REFERENCES:
patent: 4200798 (1980-04-01), Neuendorf et al.
patent: 4774720 (1988-09-01), Carbon
patent: 5440607 (1995-08-01), Nakaya
patent: 6078947 (2000-06-01), Kagermeier
patent: 6501827 (2002-12-01), Takasawa
patent: 2002/0035572 (2002-03-01), Takatori et al.

Affiliated with

Also associated with

Rating

Examination system, image processing apparatus and method,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Examination system, image processing apparatus and method,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Examination system, image processing apparatus and method,... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3563450