X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1984-06-12
1987-02-10
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 75, 378 84, G01N 2308
Patent
active
046428119
ABSTRACT:
An apparatus for performing extend X-ray absorption fine structure (EXAFS) measurements on materials. The EXAFS apparatus is constructed using a conventional X-ray powder diffractometer assembly with a rotating anode X-ray source affixed to the diffractometer assembly, a monochromator crystal rotatably positioned at the center of the assembly and a specimen stage and detectors slidingly mounted on a receiving track of the assembly. The monochromator crystal is automatically and elastically distorted to provide a monochromatic X-ray beam flux from the crystal. The angle of incidence of the source X-ray beam with the crystal surface is changed to provide a different monochromatic X-ray wavelength with changing energy, which enables measurement of the desired EXAFS spectra for the material.
REFERENCES:
patent: 3903414 (1975-09-01), Herbstein et al.
patent: 4317994 (1982-03-01), Mallozzi et al.
AIP Conference Proceedings, Laboratory EXAFS Facilities 1980 (University of Washington Workshop), edited by Edward A. Stern, American Institute of Physics, New York, 1980.
Knapp, G. S. and Georgopoulos, P., "EXAFS Study of Crystalline Materials", Crystals, Growth Properties and Applications 7, Springer-Verlag, Berlin, 1982.
Georgopoulos, P. and Knapp, G. S., "Design Criteria for a Laboratory EXAFS Facility", J. Appl. Cryst. 14, 3, (1981).
Fields Carolyn E.
Northwestern University
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