LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application

X-ray or gamma ray systems or devices – Specific application – Lithography

Gas control for X-ray lithographic system

X-ray or gamma ray systems or devices – Specific application – Absorption

Gaseous-based radiation detector and apparatus for radiography

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Gated CT with irregular sampling for slow CT acquisition

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Gated transmission and scatter detection for x-ray imaging

X-ray or gamma ray systems or devices – Specific application – Stereoscopy

General purpose X-ray tube for stereography

X-ray or gamma ray systems or devices – Specific application – Tomography

Generalized filtered back-projection reconstruction in...

X-ray or gamma ray systems or devices – Specific application – Dental panoramic

Generating panoramic views of the jaw using a fixed...

X-ray or gamma ray systems or devices – Specific application – Absorption

Generation and distribution of annotation overlays of...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Generic architectures for backprojection algorithm

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Geometric X-ray fluorescence visualizer, imager, or...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Getter for atmospheric gases in optical switch working fluid

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Glass composition determination method and apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Glass recovery method

X-ray or gamma ray systems or devices – Specific application – Absorption

Golf ball inspection using metal markers

X-ray or gamma ray systems or devices – Specific application – Absorption

Golf ball inspection using metal markers

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Goniometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Goniometer in an x-ray diffraction device

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Goniometric device particularly for X-ray or neutron diffractome

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Grading orientation errors in crystal specimens