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Method for intensity modulated radiation treatment using...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Method for intraoperative generation of an updated volume...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for intraoperative generation of an updated volume...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for localizing a target in an object

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for localizing cross-sectional dental X-ray images

X-ray or gamma ray systems or devices – Specific application – Dental panoramic
Patent

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Method for locating and evaluating subsurface uranium deposits h

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for making and reproducing a tomogram of an object,...

X-ray or gamma ray systems or devices – Specific application – Tomography
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Method for making quantitative analysis of nickel

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Method for manufacturing a device, an exposure apparatus,...

X-ray or gamma ray systems or devices – Specific application – Lithography
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Method for manufacturing a reflector for X-ray radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for manufacturing detector system for a computed tomograp

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Method for manufacturing monolithic capillary X-ray lens, a mono

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Method for marker-free automatic fusion of 2-D fluoroscopic...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for measurement of physical characteristics of crystals

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for measurement of the three-dimensional density...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for measuring and extending the service life of fatigue-l

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Method for measuring coating thickness

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Method for measuring dead time of X-ray detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for measuring dead time of X-ray detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for measuring Fe coating weight of Fe-coated stainless st

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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