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Method for detecting abnormal patterns

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Method for detecting an image of an object

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for detecting and measuring a secondary material...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Method for detecting and visualizing dynamic processes in an...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for detecting solidification in a mixed phase container

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Method for detecting the presence of high atomic number...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for determination of elastic strains present in...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for determination of the position and/or orientation...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for determining a defined position of a patient couch...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for determining a gsm substance and/or a chemical...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for determining chemical content of complex...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Method for determining constant in relational expression...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for determining degree of interconnection of solder joint

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for determining element contents using wave...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Method for determining lithological characteristics of a porous

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for determining movement and rest phases of a partial...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for determining parameters of a unit cell of a...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for determining pore volume compressibility of a porous m

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Method for determining presence distributions with local...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for determining the function representing the effect of n

X-ray or gamma ray systems or devices – Specific application – Absorption
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