X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate
1999-08-12
2001-09-04
Kim, Robert H. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Fluorescence
C378S044000, C378S050000, C378S045000, C378S022000, C250S308000
Reexamination Certificate
active
06285734
ABSTRACT:
The present invention relates to a method for defining the element contents of solid, liquid or slurry-like materials by means of an X-ray fluorescence method.
X-ray fluorescence is an analysis method where the measuring arrangement includes an X-ray source, the material to be analyzed, a monochromator and a detector. While interacting with the radiation quantums emitted from the radiation source, the atoms of the material to be analyzed create a characteristic radiation with an energy typical of the element in question and with an intensity dependent on the element contents in said material.
As regards an analysis method based on X-ray fluorescence, there are known two alternative versions, i.e. a wave dispersive and an energy dispersive analysis, which differ in their detection methods. In wave dispersive analysis, the radiation emitted from the material is conducted to a monochromator, which separates a desired characteristic energy from the energy distribution of the incoming radiation on the basis of X-ray diffraction. The radiation separated by the spectrometer is detected and measured by means of a detector. By applying the wave dispersive method, there is achieved a high resolution, owing to which adjacent element lines can be separated, and the background behind the efficiency intensity remains relatively small. In a process control online analysis, the wave dispersive method has best sensitivity and accuracy, when the element contents in the material to be processed should be measured automatically and rapidly. When applying the wave dispersive method, each energy to be measured needs an individual monochromator, detector and measurement electronics.
The energy dispersive method utilizes the fact that the height of the electric pulses produced by the detector depends on the energy of the calculated radiation quantum. By electrically separating the calculated pulses on the basis of the pulse height, there is measured the frequency of the radiation quantums with a desired energy. With the energy dispersive method, several elements can be measured by one and the same detector, but the restriction in the total pulse frequency of the detector also restricts the element intensity and hence the achieved accuracy. Often the detector resolution is not sufficient to properly separate adjacent energy lines, which reduces particularly the measuring accuracy of the weaker line. Owing to poor resolution, there also is left more background behind the line than with the wave dispersive method. In total expenses, the energy dispersive method is economical in comparison with the wave dispersive method, but the sensitivity and accuracy of the energy dispersive method are clearly poorer than those of the wave dispersive method.
The object of the present invention is to eliminate some of the drawbacks of the prior art and to achieve an improved method for defining element contents, wherein the advantages of the energy dispersive and wave dispersive methods based on X-ray fluorescence in an online analysis of the material are advantageously combined. The essential novel features of the invention are apparent from the appended claims.
According to the invention, in the definition of element contents in a material by means of X-ray fluorescence, there are applied both the energy dispersive and the wave dispersive methods, so that by means of the energy dispersive method based on X-ray fluorescence, there is advantageously measured a plurality of diffraction lines, whereas the wave dispersive method based on X-ray fluorescence is applied only for those diffraction lines where high resolution and resulting accuracy and sensitivity are required. Because the combination of energy dispersive and wave dispersive methods according to the invention is dependent on the element combination to be analyzed, an advantageous combination of the energy dispersive and wave dispersive methods can be individually selected for each element combination. Because the elements and their mutual relations in the element combination to be analyzed remain essentially unchanged in an online analysis, the combination of the energy dispersive and wave dispersive methods according to the invention can be defined before beginning the online analysis.
The method of the invention can advantageously be applied so that on an unfiltered energy dispersive channel, there are measured the most intensive element lines, which are located far from each other, in which case the resolution of the detector is sufficient. If the diffraction line intensities are remarkably different, the ratio of the intensities can be advantageously adjusted by means of a filter arranged in front of the detector. Adjacent diffraction lines and such diffraction lines where a good signal to background ratio is needed owing to low intensity are measured by means of the wave dispersive method.
According to the invention, when treating diffraction lines requiring a high resolution by means of the wave dispersive method, the detector employed in the energy dispersive method in the online analysis is advantageously a proportional counter, cheaper than a semiconductor detector, which does not have to be cooled in order to make the counter function. The radiation intensity of the energy dispersive detector is advantageously reduced by means of a field stop placed in front of the detector, so that for the detector there is achieved an intensity corresponding to a pulse treatment speed depending on the material to be analyzed, advantageously below 12 kHz. The radiation intensity obtained in the energy dispersive detector is restricted by conducting the radiation to be measured onto the detector via a hole provided in a piece arranged in front of the detector, such as a piece of lead. Moreover, when the gas contained in the proportional counter and employed in the energy dispersive method is advantageously for example argon, with a pressure advantageously within the range of 5-7 bar, the effect of high energies in the measuring result, for instance the scattering possibly created at the top end of the wavelength range of the X-ray source spectrum, are removed from the treatment. Now a large part of the spectrum in this wavelength range passes through the detector without creating a pulse. On the other hand, the effect of low energies, such as the iron fluorescence caused by a large iron content, is removed from the treatment by placing a filter, having a thickness of 0.01-0.2 mm and made of aluminium, for example, in front of the detector.
The characteristics of the apparatus employed in the method according to the invention are essentially determined on the basis of the energy dispersive method. The intensity of the X-ray source, which is inversely proportional to the period of measurement, is dimensioned to be such that the wave dispersive method can be employed. While applying for instance 35 W as the X-ray source intensity, the resulting period of measurement is 2-3 minutes, whereas while applying the X-ray source intensity 300 W, the period of measurement is shortened to roughly 15 seconds.
In the method according to the invention, there is advantageously employed at least one channel for both the energy dispersive and the wave dispersive methods. In case two or more channels are used for one or both of the methods, the wave dispersive channels are generally tuned to different wavelengths, and the energy dispersive channels are tuned to different energy ranges.
REFERENCES:
patent: 4263510 (1981-04-01), Ciccarelli et al.
patent: 4988872 (1991-01-01), Nagatsuka et al.
patent: 5430786 (1995-07-01), Komatsu et al.
patent: 5497407 (1996-03-01), Komatsu et al.
Hobden Pamela R.
Kim Robert H.
Outokumpu Oyj
Smith-Hill and Bendell
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