Method for detecting abnormal patterns

Details Method for detecting abnormal patterns Method for detecting abnormal patterns

1996-10-09

1998-03-24

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Absorption

250584, G01N 2304

Patent

active

057321213

ABSTRACT:
Prospective abnormal patterns in a radiation image of an object are detected in accordance with an image signal representing the radiation image. A probability density function of the image signal, which corresponds to a region, that is inward from a contour of each of the prospective abnormal patterns having been detected, and a neighboring region, is formed. Probability density function information in accordance with the probability density function is obtained. A definite prospective abnormal pattern, which is among the prospective abnormal patterns having been detected and has a high level of probability that it will be the true abnormal pattern, is detected in accordance with the probability density function information.

REFERENCES:
patent: 4991092 (1991-02-01), Greensite
patent: 5157733 (1992-10-01), Takeo et al.
patent: 5481623 (1996-01-01), Hara
patent: 5583346 (1996-12-01), Hakajima
"Detection of Tumor Patterns in DR Images (Iris Filter)", Obata et al., Collected Papers of the Institute of Electronics and Communication Engineers of Japan, D-II, J75-D-11, No. 3, pp. 663-670, Mar. 1992.

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