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Apparatus for measuring the sulfur component contained in oil

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus for measuring the thickness of a coating

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus for measuring the thickness of thin layers

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus for measuring the thickness of thin layers

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus for simultaneous X-ray diffraction and X-ray fluoresce

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus for stabilization of X-ray fluorescence layer thicknes

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus for the analysis of a solution by X-ray fluorescence

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Apparatus for the measurement of the thickness and concentration

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus for X-ray analysis in grazing exit conditions

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Apparatus used for total reflection fluorescent X-ray analysis o

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Arrangement for the non-destructive measurement of metal traces

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Automated x-ray fluorescence analysis

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Automatic steel analysis apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Automatic X-ray correction device

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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