X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1996-09-30
1998-04-28
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378 83, G01N 23223
Patent
active
057455430
ABSTRACT:
In the case of simultaneous diffraction and fluorescence measurements in an apparatus for X-ray analysis comprising only one X-ray tube, a problem is encountered in that due to the presence of the collimators required for the fluorescence measurements only a very low X-ray power reaches the detectors, so that very long measuring times and/or an unfavorable signal-to-noise ratio occur. As a result, the detection limit for given measurements (low concentration of an element and/or light elements to be detected) becomes too high or the use of a (large and expensive) high-power X-ray tube is required. The invention utilizes a line focus tube 10 in combination with a single-slit collimator 14 for irradiating the sample 2, the fluorescence section 40 being constructed so as to have a plane or cylindrical analysis crystal 42 in combination with a location-sensitive detector 44. The diffraction measurements are performed by means of a conventional diffraction arrangement 24.
REFERENCES:
patent: 4800580 (1989-01-01), Houtman et al.
patent: 5406608 (1995-04-01), Yellepeddi et al.
De Bokx Pieter K.
Van Der Sluis Paul
Vrebos Bruno A. R.
Barschall Anne E.
Church Craig E.
U.S. Philips Corporation
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