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Technique and apparatus for two-phase systems analysis directly

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Test-sensor production monitoring using XRF spectrometry

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Thin film forming apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Time of flight aspects for X-Ray fluorescence visualizer,...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Time resolved extended X-ray absorption fine structure spectrome

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Tool based X-ray fluorescence visualizing, imaging, or...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Total reflection X-ray fluorescence analysis method

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Total reflection X-ray fluorescence apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Total reflection X-ray fluorescence apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Total reflection X-ray fluorescence apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Total-reflection x-ray fluorescence apparatus and method...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Two-stage x-ray concentrator

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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