Automated x-ray fluorescence analysis

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Reexamination Certificate

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C378S057000, C209S589000

Reexamination Certificate

active

07899153

ABSTRACT:
A method for classifying a sample based upon a complete spectral analysis. The sample is illuminated with penetrating radiation and an initial complete spectral analysis is performed based on spectral resolution of resonant fluorescence lines emitted at the surface, or within the volume, of the sample. If the initial complete spectral analysis yields the composition of the sample to within acceptable limits, analysis values are output to the user. Otherwise, further analysis, informed by the results if the initial complete spectral analysis, is performed.

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patent: 2006/0029182 (2006-02-01), Tani et al.
patent: 2008/0205592 (2008-08-01), Connors et al.
Yoshiyuki Kataoka, “Standardless X-Ray Fluorescence Spectrometry (Fundamental Parameter Method Using Sensitivity Library),” The Rigaku Journal, vol. 6 (1), 1989, pp. 33-40.

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