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Method for controlling the temperature of an electronic...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Reexamination Certificate

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Method for detecting a state of substance existing in pipe

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent

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Method for detecting the spalling of a layer of buildup of a...

Thermal measuring and testing – Leak or flaw detection
Reexamination Certificate

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Method for detection of thermal waves with a laser probe

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent

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Method for evaluating solder joint portion

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method for evaluation of quality of the interface between layer

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent

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Method for identifying surface conditions of a moving medium

Thermal measuring and testing – Leak or flaw detection
Patent

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Method for inspecting connection state of electronic part...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Reexamination Certificate

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Method for laser scanning flip-chip integrated circuits

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method for local temperature sensing for use in performing high

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent

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Method for monitoring the wear and extending the life of blast f

Thermal measuring and testing – Leak or flaw detection
Patent

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Method for nondestructive/noncontact microwave detection of...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method for nondestructive/noncontact microwave detection of...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method for optimizing direct wafer bond line width for...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method for the inspection of a part by thermal imaging

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method of analyzing electrical connection and test system

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method of and an apparatus for photothermally examining workpiec

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent

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Method of and apparatus for detecting corrosion utilizing infrar

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent

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Method of and apparatus for thermographic evaluation of spot wel

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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Method of and system for inspecting performance of heat-insulati

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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