Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent
1996-03-22
1998-11-10
Bennett, G. Bradley
Thermal measuring and testing
Leak or flaw detection
With heating or cooling of specimen for test
374 43, G01N 2572
Patent
active
058333657
ABSTRACT:
An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.
REFERENCES:
patent: 3530377 (1970-09-01), Tanzman
patent: 4210024 (1980-07-01), Ishiwatari et al.
patent: 4775838 (1988-10-01), Mizuta et al.
patent: 5032727 (1991-07-01), Cox, Jr. et al.
patent: 5224775 (1993-07-01), Reading et al.
Ceuninck Ward De
De Schepper Luc
Roggen Jean
Stals Lambert
Bennett G. Bradley
Interuniversitair Micro-Electronika Centrum vzw
Limburgs Universitair Centrum
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