Method for local temperature sensing for use in performing high

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test

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374 43, G01N 2572

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active

058333657

ABSTRACT:
An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.

REFERENCES:
patent: 3530377 (1970-09-01), Tanzman
patent: 4210024 (1980-07-01), Ishiwatari et al.
patent: 4775838 (1988-10-01), Mizuta et al.
patent: 5032727 (1991-07-01), Cox, Jr. et al.
patent: 5224775 (1993-07-01), Reading et al.

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