Method for controlling the temperature of an electronic...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test

Reexamination Certificate

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Details

C374S045000, C374S029000, C324S760020, C324S765010, C702S130000

Reexamination Certificate

active

06886976

ABSTRACT:
A combined heater and heat sink assembly regulates the temperature of a device under test. The combined heating/cooling assembly includes a heater assembly inlay that is received within a heat sink. The heater assembly includes a heating surface that is coplanar with a cooling surface of the heat sink. In operation, the heating/cooling assembly provides concurrent hot and cold contact points for the device under test. The heater assembly is thermally insulated from the heat sink such that the majority of the heat generated by the heater assembly is directly applied to the device under test; very little of the generated heat is lost to the heat sink. On the other hand, the heat sink provides a relatively low thermal resistance between the device under test and a cold source such as a coolant. Accordingly, the combined heating/cooling assembly provides parallel thermal paths between the device under test and both a hot source and a cold source.

REFERENCES:
patent: 2769334 (1956-11-01), Soehngen
patent: 3258957 (1966-07-01), Desmond
patent: 3724536 (1973-04-01), Baxter
patent: 3733887 (1973-05-01), Stanley et al.
patent: 4481403 (1984-11-01), Del Monte
patent: 4630938 (1986-12-01), Piorkowska-Palczewska et al.
patent: 4696578 (1987-09-01), Mansuria et al.
patent: 4839587 (1989-06-01), Flatley et al.
patent: 4840495 (1989-06-01), Bonnefoy
patent: 4859078 (1989-08-01), Bowman et al.
patent: 5006796 (1991-04-01), Burton et al.
patent: 5164661 (1992-11-01), Jones
patent: 5246291 (1993-09-01), Lebeau et al.
patent: 5315240 (1994-05-01), Jones
patent: 5420521 (1995-05-01), Jones
patent: 5456081 (1995-10-01), Chrysler et al.
patent: 5702185 (1997-12-01), Heikal
patent: 5821505 (1998-10-01), Tustaniwskyj et al.
patent: 5831349 (1998-11-01), Weng
patent: 5844208 (1998-12-01), Tustaniwskyj et al.
patent: 5847366 (1998-12-01), Grunfeld
patent: 5907246 (1999-05-01), Abraham et al.
patent: 5911897 (1999-06-01), Hamilton
patent: 5915838 (1999-06-01), Stals et al.
patent: 5918665 (1999-07-01), Babcock et al.
patent: 5940784 (1999-08-01), El-Husayni
patent: 5977785 (1999-11-01), Burward-Hoy
patent: 6039471 (2000-03-01), Wyland
patent: 6092926 (2000-07-01), Still et al.
patent: 6119460 (2000-09-01), Huang
patent: 6144215 (2000-11-01), Maxwell et al.
patent: 6322626 (2001-11-01), Shirley
patent: 6389225 (2002-05-01), Malinoski et al.
patent: 6545494 (2003-04-01), Olsen et al.
patent: 6552561 (2003-04-01), Olsen et al.
patent: 6717115 (2004-04-01), Pfahnl et al.
patent: 6809930 (2004-10-01), Mueller et al.
patent: 20020136261 (2002-09-01), Naka et al.

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