Determining optimal time instances to sense the output of a...

Determining relative amount of usage of data retaining...

Determining relative amount of usage of data retaining...

Device and method for breaking leakage current path of...

Device and method for compensating defect in semiconductor...

Device and method for controlling refresh rate of memory

Device and method for detecting alignment of bit lines and...

Device and method for detecting alignment of deep trench...

Device and method for detecting corruption of digital...

Device and method for driving a conductive path with a signal

Device and method for driving a conductive path with a signal

Device and method for margin testing a semiconductor memory by a

Device and method for margin testing a semiconductor memory by a

Device and method for margin testing a semiconductor memory...

Device and method for margin testing a semiconductor memory...

Device and method for margin testing a semiconductor memory...

Device and method for non-volatile storage of a status value

Device and method for performing a partial array refresh...

Device and method for reducing standby current in a memory...

Device and method for reducing standby current in a memory...