Device and method for compensating defect in semiconductor...

Details Device and method for compensating defect in semiconductor... Device and method for compensating defect in semiconductor...

2007-04-10

2007-04-10

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S120000, C365S230060, C365S230080, C365S189050

Reexamination Certificate

active

11306381

ABSTRACT:
A device for compensating a semiconductor memory defect, suitable for use in a semiconductor memory, is provided. The device includes a memory array, having at least a defectless sub-memory region, the memory array being coupled to an address decoder circuit and a sensing circuit for storing data. A selection circuit is coupled to a control unit and outputs a selection signal to the control unit. A first input address buffer is coupled to the control unit and the address decoder circuit, and outputs an address signal to the address decoder circuit in response to the selection signal for selecting the defectless sub-memory region to store data. A method for compensating a semiconductor memory defect is also provided, including determining whether the memory region of the semiconductor memory has a defect; and replacing the memory region with the defectless sub-memory region to store data when the semiconductor memory is defective.

REFERENCES:
patent: 4007452 (1977-02-01), Hoff, Jr.
patent: 4376300 (1983-03-01), Tsang
patent: 5233559 (1993-08-01), Brennan, Jr.
patent: 6018482 (2000-01-01), Fujita
patent: 6310807 (2001-10-01), Ooishi et al.
patent: 7020003 (2006-03-01), Yeh

Affiliated with

Also associated with

Rating

Device and method for compensating defect in semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and method for compensating defect in semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for compensating defect in semiconductor... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3784333