LandOfFree - US Patents - Listing for Optics: measuring and testing

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Overlay mark, method of measuring overlay accuracy, method...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Overlay measurement apparatus

Optics: measuring and testing – Position or displacement – Position transverse to viewing axis

Reexamination Certificate

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Overlay measurement target

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Overlay measurement target

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Overlay measurements using zero-order cross polarization...

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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Overlay measurements using zero-order cross polarization...

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Overlay measuring method and related semiconductor...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Overlay metrology method and apparatus using more than one...

Optics: measuring and testing – By alignment in lateral direction – With light detector

Reexamination Certificate

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Overlay metrology using scatterometry profiling

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Overlay target and measurement method using reference and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Overlay target and measurement method using reference and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Overlay targets with isolated, critical-dimension features...

Optics: measuring and testing – Shape or surface configuration

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Overlay targets with isolated, critical-dimension features...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Overmolded flowthrough turbidity sensor

Optics: measuring and testing – For light transmission or absorption – Of fluent material

Patent

[ 0.00 ] – not rated yet Voters 0 Comments 0

Oximeter apparatus

Optics: measuring and testing – Blood analysis – Hemoglobin concentration

Patent

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Ozone concentration sensor

Optics: measuring and testing – For light transmission or absorption

Reexamination Certificate

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