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Three dimensional digitizer using multiple methods

Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate

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Three dimensional imaging device

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Three dimensional imaging device

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Three dimensional imaging method and device

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Three dimensional information measurement method and apparatus

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate

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Three dimensional inspection system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Three dimensional inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Three dimensional laser beam survey system

Optics: measuring and testing – For optical fiber or waveguide inspection
Patent

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Three dimensional laser control and tracking system

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate

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Three dimensional laser Doppler velocimeter

Optics: measuring and testing – Velocity or velocity/height measuring – With light detector
Patent

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Three dimensional lead inspection system

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Three dimensional mapping systems and methods

Optics: measuring and testing – Range or remote distance finding – Triangulation ranging to a point with one projected beam
Patent

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Three dimensional measurement apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Three dimensional measurement system and pickup apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Three dimensional measurement system and pickup apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Three dimensional moire pattern alignment

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Three dimensional object surface determination with automatic se

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Three dimensional optical scanner

Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate

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Three dimensional position measurement system using an interfero

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Three dimensional profile inspecting apparatus

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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