Three dimensional position measurement system using an interfero

Details Three dimensional position measurement system using an interfero Three dimensional position measurement system using an interfero

1985-05-10

1987-11-17

Willis, Davis L.

Optics: measuring and testing

Range or remote distance finding

With photodetection

356358, 356363, G01B 902

Patent

active

047071290

ABSTRACT:
An interferometer having a beam generating section and a reflecting section. Mechanisms are provided to direct a beam from the generating section to the reflecting section even when the reflecting section moves freely in three dimensions. Mechanisms are also provided to direct the beam back from the reflecting section to the generating section even when the reflecting section moves freely in three dimensions. A method is presented that enables the absolute distance between the generating and reflecting sections to be determined.

REFERENCES:
patent: 3458259 (1969-01-01), Bagley et al.
patent: 3715599 (1973-02-01), Marcy
patent: 3788746 (1974-01-01), Baldwin et al.
patent: 4457625 (1984-07-01), Greenleaf et al.
Watson, John T., The Itek Contour Measuring Interferometer.

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