Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-12-03
1996-05-07
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
364560, G01B 1102, G01B 1124
Patent
active
055151680
ABSTRACT:
A device for the identification and classification of subjects having variable non-standardized shapes, has a device (1) for taking views, a module (2) for the acquisition and processing of the views and for the extraction of at least one given characteristic dimensional parameter, and a module (3) for identification and classification of the studied subjects from the extracted characteristic parameters.
REFERENCES:
patent: 4885844 (1989-12-01), Chun
patent: 4975969 (1990-12-01), Tal
patent: 5163006 (1992-11-01), Deziel
Baylou et al., "Analyse Automatique du Profil du Visage, Recherche du Meilleur Classifieur a Fin d'Identification", Artificielle, Sep., 1981, pp. 371-382.
Evans F. L.
Telmat Informatique, E.U.R.L.
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