Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2005-03-08
2005-03-08
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237500, C438S018000, C438S029000
Reexamination Certificate
active
06864972
ABSTRACT:
The present invention is directed analysis of a flip-chip integrated circuit die having SOI structure that improves the ability to image and analyze selected portions of circuitry in the die. According to an example embodiment of the present invention, a lens is formed in a back side of a flip-chip die and over the insulator portion of SOI structure in the die. Light is directed at the lens and the lens is used to focus the light to target circuitry in the die. A reflection from the circuitry is detected and used to analyze the die, such as by imaging the circuitry in the die and identifying defects therein. The lens formed in the die enhances the ability to focus light to selected circuitry in the die and improves the ability to analyze dies having SOI structure through the insulator.
REFERENCES:
patent: 5220403 (1993-06-01), Batchelder et al.
patent: 5247392 (1993-09-01), Plies
patent: 5604635 (1997-02-01), Lawandy
Birdsley Jeffrey D.
Bruce Michael R.
Davis Brennan V.
Ring Rosalinda M
Stone Daniel L.
Advanced Micro Devices , Inc.
Barth Vincent P.
Rosenberger Richard A.
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