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Forward scattering laser particulate sensor

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Forward-scatter visibility meter

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Foucault knife-edge test for quantitatively determining a wavefr

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Foucault method for testing an optical surface

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Four color tomato grader

Optics: measuring and testing – By shade or color – With sample responsive to plural colors applied simultaneously
Patent

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Four mode Zeeman laser gyroscope with minimum hole burning compe

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Four step discrete phase shift demodulation method for fiber opt

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Four wheel alignment apparatus and method

Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent

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Four-mode stabilized solid-state gyrolaser without blind region

Optics: measuring and testing – Velocity or velocity/height measuring – With light detector
Reexamination Certificate

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Four-stage type monochromator

Optics: measuring and testing – By dispersed light spectroscopy – With monochromator structure
Reexamination Certificate

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Fourier detection of species migrating in a microchannel

Optics: measuring and testing – By electrophoresis
Reexamination Certificate

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Fourier detection of species migrating in a microchannel

Optics: measuring and testing – By electrophoresis
Patent

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Fourier detection of species migrating in a microchannel

Optics: measuring and testing – By electrophoresis
Patent

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Fourier domain low-coherence interferometry for light...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Fourier domain low-coherence interferometry for light...

Optics: measuring and testing – By light interference – For dimensional measurement
Reissue Patent

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Fourier filters and wafer inspection systems

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Fourier filters and wafer inspection systems

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Fourier filters, inspection systems, and systems for...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Fourier filters, systems for fabricating fourier filters,...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Fourier moire wavefront sensor

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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